The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2008
Filed:
Sep. 06, 2006
Applicants:
Masamitsu Sakurai, Kanagawa, JP;
Tatsuo Tani, Chiba, JP;
Hiroshi Uramoto, Kanagawa, JP;
Hiromitsu Hatano, Tokyo, JP;
Inventors:
Masamitsu Sakurai, Kanagawa, JP;
Tatsuo Tani, Chiba, JP;
Hiroshi Uramoto, Kanagawa, JP;
Hiromitsu Hatano, Tokyo, JP;
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An environmental impact information collection system modifies and analyzes environmental impact information, which is collected and stored in advance, and obtains the environmental impact at each process done in an organization, according to each product. The environmental impact information collection system then obtains a set of environmental impacts in a product's life cycle.