The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2008
Filed:
Oct. 26, 2001
Chien-hsin Lin, Sunnyvale, CA (US);
Chang-ming Yang, San Jose, CA (US);
Chien-Hsin Lin, Sunnyvale, CA (US);
Chang-Ming Yang, San Jose, CA (US);
NXP B.V., Eindhoven, NL;
Abstract
Artifact detection and counting is enhanced using looping in both the horizontal and vertical direction is enhanced via a reduced bandwidth for accumulation of count values into count table entries. According to an example embodiment of the present invention, first and second loops are made for horizontal and vertical count table entries. Quotient and remainder values of a detected artifact value are used for increasing count table entries in the first looping pass, and the count table entries are increased using the quotient value in the second loop. The table increase in the first loop is limited to the length of the remainder value, and the table increase in the second loop is limited to the length of the row or column in the count table being used. In this manner, latency for additions to the count table and the bandwidth for making the additions are reduced, relative to conventional applications. In addition, each entry into the table can be reduced to one addition.