The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2008

Filed:

Dec. 22, 2005
Applicants:

Bertrand Baillon, Valence, FR;

Laurence Mutuel, Saint Vincent la Commanderie, FR;

Jean-pierre Schlotterbeck, Rochefort-Samson, FR;

Inventors:

Bertrand Baillon, Valence, FR;

Laurence Mutuel, Saint Vincent la Commanderie, FR;

Jean-Pierre Schlotterbeck, Rochefort-Samson, FR;

Assignee:

Thales, , FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a device for remote measurement of the properties of the atmosphere, more particularly a device used to detect atmospheric turbulence. The device operates on the lidar principle, using the backscattering of a laser beam by the air. The device comprises a laser emission source (), optical means () for collecting a backscattered beam () that is backscattered by targets illuminated by the emission source (), the backscattered beam () being substantially centerd about the wavelength of the emission source (), and means () for generating interference fringes () resulting from the backscattered beam (). The device also includes a spatial filter () allowing only a central spot of the interference fringes to be seen and, at the center of the spatial filter (), a mask for blocking off the center of the central spot and more particularly the Mie line of the backscattered beam.


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