The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2008
Filed:
Mar. 15, 2006
Xiaoliang Sunney Xie, Lexington, MA (US);
Feruz Ganikhanov, Annandale, NJ (US);
Conor Evans, Cambridge, MA (US);
Xiaoliang Sunney Xie, Lexington, MA (US);
Feruz Ganikhanov, Annandale, NJ (US);
Conor Evans, Cambridge, MA (US);
President and Fellows of Harvard College, Cambridge, MA (US);
Abstract
A system is disclosed for detecting a nonlinear coherent field induced in a sample. The system includes optics, a modulation system, and a detector system. The optics are for directing a first electromagnetic field at a first frequency ωand a second electromagnetic field at a second frequency ωtoward a focal volume such that a difference frequency ω–ωis resonant with a vibrational frequency of a sample in the focal volume. The modulation system is for modulating the difference frequency ω–ωsuch that the difference frequency ω–ωis tuned in and out of the vibrational frequency of the sample of at a modulation frequency. The detector system is for detecting an optical field that is generated through non-linear interaction of ωand ωand the sample responsive to the modulation frequency.