The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7352321 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 01, 2008

Filed:

Sep. 22, 2005
Applicants:

Wieslaw Jerzy Szajnowski, Surrey, GB;

Miroslaw Bober, Surrey, GB;

Inventors:

Wieslaw Jerzy Szajnowski, Surrey, GB;

Miroslaw Bober, Surrey, GB;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An entity is subjected to an interrogating signal, and the reflection from the entity is repeatedly sampled to obtain a first set of values each dependent on the intensity of the reflected signal. A logarithmic transformation is applied to the sample values to obtain a second set of values. A set of descriptor values is derived, the set comprising at least a first descriptor value (L) representing the difference between the mean and the median of the second set of values, and a second descriptor value (D) representing the mean of the absolute value of the deviation between each second set value and an average of the second set of values.


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Szajnowski, Wieslaw. (2008). Determining statistical descriptors of a signal from a set of its samples (U.S. Patent No. 7352321). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7352321

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