The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2008
Filed:
Apr. 14, 2005
Mohsen Hossein Mardi, Fremont, CA (US);
David M. Mahoney, San Jose, CA (US);
Mohsen Hossein Mardi, Fremont, CA (US);
David M. Mahoney, San Jose, CA (US);
Xilinx, Inc., San Jose, CA (US);
Abstract
A test system configuration is provided to enable testing of integrated circuit (IC) packages. The test system includes a test controller, an interface apparatus including a PC board with lines connecting the test controller to contact areas for contacting the IC packages and a handler for supporting the IC chips and interface apparatus to maintain electrical connections during testing. The handler includes docking plates for attaching to the PC board to provide a guide for the IC packages that are inserted in openings of the docking plates to align contacts of the IC packages and PC board. The docking plates are configured to provide quad (four) and octal (eight) test sites, with either the quad or octal docking plate mating to the same PC board and being supported in the same handler system. An alignment frame for mounting either the quad or octal docking plate is further provided as part of the handler.