The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2008
Filed:
Oct. 31, 2005
Quan Chen, Fredericton, CA;
Bruce Balcom, Fredericton, CA;
Quan Chen, Fredericton, CA;
Bruce Balcom, Fredericton, CA;
Green Imaging Technologies Inc., Fredericton, CA;
Abstract
A method and apparatus are provided for measuring a parameter such as capillary pressure in porous media such as rock samples. The method comprises mounting a sample in a centrifuge such that different portions of the sample are spaced at different distances from the centrifuge axis, rotating the sample about the axis, measuring a first parameter in the different portions of the sample, and determining the value of a second parameter related to the force to which each portion is subjected due to rotation of the sample. In one embodiment, the first parameter is relative saturation of the sample as measured by MRI techniques, and the second parameter is capillary pressure.