The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2008

Filed:

May. 13, 2005
Applicants:

Kevin M. Hayden, Newton, NH (US);

Marvin L. Vestal, Framingham, MA (US);

Jennifer M. Campbell, Somerville, MA (US);

Inventors:

Kevin M. Hayden, Newton, NH (US);

Marvin L. Vestal, Framingham, MA (US);

Jennifer M. Campbell, Somerville, MA (US);

Assignees:

Applera Corporation, Framingham, MA (US);

MDS Inc., Concord, Ontario, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/16 (2006.01); H01J 49/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present teachings relate to MALDI-TOF instruments, instrument components, and methods of operation thereof. In various aspects, the MALDI-TOF instrument can serve and be operated as a MS/MS instrument. In various embodiments, provided are MALDI-TOF instruments, and methods of operating one or more components of a MALDI-TOF instrument, that facilitate one or more of increasing sensitivity, increasing resolution, increasing dynamic mass range, increasing sample support throughput, and decreasing operational downtime.


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