The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 01, 2008
Filed:
Jan. 19, 2006
Yves Le Blanc, Toronto, CA;
Yves Le Blanc, Toronto, CA;
MDC Inc., Concord, CA;
Applera Corporation, Norwalk, unknown;
Abstract
Methods and systems for obtaining mass spectrographic data of a substance. Methods include subjecting a substance to a chromatographic process or other separating process, ionizing the output thereof, and subjecting the ionized output to recursive mass spectrometry analyses; and provide improved processing and analysis of data acquired during the repeated analyses. Systems according to one aspect of the invention comprise ion sources, mass spectrometers capable of analyzing ions of selected mass, and controllers adapted to receive from the mass spectrometers and retain signals representing data representing pluralities of mass spectrograms. The controllers can be adapted to generate information useful for describing extracted ion chromatograms, using data associated with the pluralities of mass spectrograms and non-linear curve approximation algorithms; and to use the generated information to generate further information useful in further analysis of the ionized substance.