The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 01, 2008

Filed:

Jun. 05, 2002
Applicant:

Bruce Martin Levine, Arcadia, CA (US);

Inventor:

Bruce Martin Levine, Arcadia, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ophthalmic imaging instrument includes a wavefront sensor-based adaptive optical subsystem () that measures phase aberrations in reflections derived from light produced by an imaging light source () and compensates for such phase aberrations when capturing images of reflections derived from light produced by the same imaging light source (). In another aspect, a modular fundus camera () includes an adaptive optical module () that detachably interfaces to a fundus camera body and image capture subsystem (). In another aspect, an ophthalmic instrument includes an integral wavefront sensor () and display device (), wherein the wavefront sensor () measures phase aberrations in reflections directed thereto to characterize aberrations of the eye and is operably coupled to the display device (), which displays a graphical representation of the aberrations of the eye.


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