The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2008

Filed:

Feb. 15, 2006
Applicants:

Parthasarathy Ranganathan, Fremont, CA (US);

Khaldoun Alzien, Houston, TX (US);

Phillip Leech, Houston, TX (US);

Inventors:

Parthasarathy Ranganathan, Fremont, CA (US);

Khaldoun Alzien, Houston, TX (US);

Phillip Leech, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01); G06F 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a method for estimating a condition of an electronic device, a model correlating at least one utilization metric of a component of the electronic device and the condition of the component to be estimated is formulated. In addition, the at least one utilization metric of the component is detected and the condition of the component and the electronic device are estimated based upon the formulated model with the detected at least one utilization metric as an input to the formulated model.


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