The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2008
Filed:
Dec. 02, 2004
Heinrich Gotzig, Heibronn, DE;
Oliver Eckstein, Felbach, DE;
Marion Henry, Nantes, FR;
Thomas Jung, Untergruppenbach, DE;
Nicolas Jecker, Esslingen, DE;
Heinrich Gotzig, Heibronn, DE;
Oliver Eckstein, Felbach, DE;
Marion Henry, Nantes, FR;
Thomas Jung, Untergruppenbach, DE;
Nicolas Jecker, Esslingen, DE;
Valeo Shalter und Sensoren GmbH, Bietigheim-Bissingen, DE;
Abstract
The invention relates to a method for determining the position (x, y) of at least one point of reflection (R) on an obstacle. According to traditional methods of this kind a first distance (r) between the point of reflection (R) and a first position (x) of a distance measuring device is calculated by evaluating a time period between the emission of a transmission signal and reception of a reflection signal. In order to state the unsharp position of the point of reflection thereby obtained even more precisely, in addition to the first distance (r), a second distance (r) of the point of reflection is calculated with respect to a second position (x) of the distance measuring device in analogy to the calculation of the first distance (r) and then a defined position (x, y) is calculated from the pair of variates (x, r) (x, r) so obtained using the triangulation method.