The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2008

Filed:

Feb. 25, 2004
Applicant:

Takaharu Hamada, Osaka, JP;

Inventor:

Takaharu Hamada, Osaka, JP;

Assignee:

H & T Corporation, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A safety test support system comprises application storage, an application activating means, check program storageand an inspection conducting means. The application storagestores applications for safety tests, which are functionally partitioned according to data items and/or operations. The application activating meansactivates at least one application selected from the applications. The check program storagestores check programs each for detecting a change or changes in one of the applications during the system operation. The inspection conducting meansdetects the changes in the applications by sequentially executing the stored check programs in response to an inspection conducting signal. Accordingly, the support system carries out an inspection to automatically detect the changes during the system operation so that the system can comply reliably with the GLP and other standards.


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