The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 25, 2008

Filed:

Aug. 26, 2005
Applicants:

Kenneth F. Emigholz, Chevy Chase, MD (US);

Robert K. Wang, Vienna, VA (US);

Stephen S. Woo, Markham, CA;

Richard B. Mclain, Brambleton, VA (US);

Sourabh K. Dash, Beaumont, TX (US);

Thomas A. Kendi, Rotterdam, NL;

Inventors:

Kenneth F. Emigholz, Chevy Chase, MD (US);

Robert K. Wang, Vienna, VA (US);

Stephen S. Woo, Markham, CA;

Richard B. McLain, Brambleton, VA (US);

Sourabh K. Dash, Beaumont, TX (US);

Thomas A. Kendi, Rotterdam, NL;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G05B 11/01 (2006.01); G01R 27/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

Thousands of process and equipment measurements are gathered by the modern digital process control systems that are deployed in refineries and chemical plants. Several years of these data are historized in databases for analysis and reporting. These databases can be mined for the data patterns that occur during normal operation and those patterns used to determine when the process is behaving abnormally. These normal operating patterns are represented by sets of models. These models include simple engineering equations, which express known relationships that should be true during normal operations and multivariate statistical models based on a variation of principle component analysis. Equipment and process problems can be detected by comparing the data gathered on a minute by minute basis to predictions from these models of normal operation. The deviation between the expected pattern in the process operating data and the actual data pattern are interpreted by fuzzy Petri nets to determine the normality of the process operations. This is then used to help the operator localize and diagnose the root cause of the problem.


Find Patent Forward Citations

Emigholz, Kenneth. (2008). System and method for abnormal event detection in the operation of continuous industrial processes (U.S. Patent No. 7349746). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7349746

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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