The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2008
Filed:
Oct. 07, 2002
Hayden C Cranford, Jr., Apex, NC (US);
Vernon R. Norman, Cary, NC (US);
Martin L. Schmatz, Rueschlikon, CH;
Hayden C Cranford, Jr., Apex, NC (US);
Vernon R. Norman, Cary, NC (US);
Martin L. Schmatz, Rueschlikon, CH;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system and method is disclosed for evaluating a data group of oversampled bits to detect edge transitions and for improving use of information available from a sampled data while maintaining acceptable noise rejection. An edge detection system for receiving a serial data stream includes a sampler for collecting a sample pattern from the serial data stream, the sample pattern including a succession of a plurality of data samples from the data stream with the plurality of data samples including multiple samples during a bit time associated with the data stream; a memory, coupled to the sampler, for storing one or more successive sample patterns; and a correlator, coupled to the memory, for producing a sample condition signal using a set of predefined patterns by comparing the stored sampled patterns to the predefined patterns.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile