The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2008
Filed:
Aug. 12, 2004
Takayuki Kei, Musashino, JP;
Takayuki Kei, Musashino, JP;
Yokogawa Electric Corporation, Musahino-shi, JP;
Abstract
This invention is characterized by the following feature. A three-dimensional confocal microscope system for performing image processing based on image pickup data of sliced images of a sample outputted from a confocal scanner and thus acquiring a three-dimensional image of the sample, the system comprising a correction unit for correcting brightness of the sliced images on the basis of depth of the sample. Thus, a three-dimensional confocal microscope system that corrects changes in the brightness of the image due to the depth of the sample and thus achieves uniform brightness of the image at any point in the direction of depth can be realized.