The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2008
Filed:
Aug. 31, 2005
Applicants:
Hiren D. Thacker, Atlanta, GA (US);
Oluwafemi O. Ogunsola, Atlanta, GA (US);
James D. Meindl, Marietta, GA (US);
Inventors:
Hiren D. Thacker, Atlanta, GA (US);
Oluwafemi O. Ogunsola, Atlanta, GA (US);
James D. Meindl, Marietta, GA (US);
Assignee:
Georgia Tech Research Corporation, Atlanta, GA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01R 31/302 (2006.01); G01R 31/308 (2006.01);
U.S. Cl.
CPC ...
Abstract
Probe modules, methods of use of probe modules, and methods of preparing probe modules, are disclosed. A representative embodiment of a probe module, among others, includes a redistribution substrate and a probe substrate interfaced with the redistribution substrate. The probe substrate is operative to test at least one signal of at least one optoelectronic device under test. The probe substrate is operative to interface with electrical and optical components.