The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7347417 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 25, 2008

Filed:

Nov. 27, 2004
Applicant:

Oliver Kutzer, Radolfzell, DE;

Inventor:

Oliver Kutzer, Radolfzell, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65H 7/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

To detect overlapping flat mailpieces in a transport path that are transported vertically in succession at least two transport stages are successively arranged. Each transport stage has a nominal speed, wherein the nominal speed of a following transport stage in a transport direction is higher than the nominal speed of the preceding transport stage. A speed of the transported mailpieces is measured by scanning the items in front of a following transport stage for a maximum distance that is shorter than a shortest agreed mailpiece length by means of two sensors. Measured results are evaluated if a sensor measures a speed that deviates only slightly by a defined small value from the nominal speed of the following transport stage. An overlap is detected if simultaneously measured speeds of the two sensors are different and a smaller measured speed deviates from a greater speed by a defined value.


Find Patent Forward Citations

Kutzer, Oliver. (2008). Method and arrangement for detecting overlapping flat mailpieces (U.S. Patent No. 7347417). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7347417

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