The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2008
Filed:
Sep. 17, 2003
Charles E. Biss, Auburn, NY (US);
Andrew Longacre, Jr., Skaneateles, NY (US);
William H. Havens, Marcellus, NY (US);
Donna M. Fletcher, Auburn, NY (US);
Eunice Sonneville, Ontario, NY (US);
Charles E. Biss, Auburn, NY (US);
Andrew Longacre, Jr., Skaneateles, NY (US);
William H. Havens, Marcellus, NY (US);
Donna M. Fletcher, Auburn, NY (US);
Eunice Sonneville, Ontario, NY (US);
Hand Held Products, Inc., Skaneateles Falls, NY (US);
Abstract
The invention is an apparatus configured to provide self-alignment in use when measuring the print quality of an encoded indicium. The apparatus is configured to exclude ambient light, and to align an encoded indicium located at a first aperture defined in a first surface of the apparatus with an imager positioned at a second aperture defined in a second surface of the apparatus. A source of illumination is provided to illuminate the encoded indicium during an interval when the encoded indicium is undergoing a verification process. An illumination control is provided to control the source of illumination. The apparatus can be controlled using a computer and a computer program recorded on a machine-readable medium.