The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2008
Filed:
Dec. 03, 2004
Xiaoxun Zhu, Marlton, NJ (US);
Yong Liu, Suzhou, CN;
Ka Man AU, Philadelphia, PA (US);
Rui Hou, Suzhou, CN;
Hongpeng Yu, Tianjin, CN;
Xi Tao, Suzhou, CN;
Liang Liu, Suzhou, CN;
Wenhua Zhang, Suzhou, CN;
Anatoly Kotlarsky, Holland, PA (US);
Sankar Ghosh, Boothwyn, PA (US);
Michael Schnee, Aston, PA (US);
Pasqual Spatafore, Marlton, NJ (US);
Thomas Amundsen, Turnersville, NJ (US);
Sung Byun, Cherry Hill, NJ (US);
Mark Schmidt, Williamstown, NJ (US);
Garrett Russell, Wilmington, DE (US);
John Bonanno, Woodbury, NJ (US);
C. Harry Knowles, Moorestown, NJ (US);
Xiaoxun Zhu, Marlton, NJ (US);
Yong Liu, Suzhou, CN;
Ka Man Au, Philadelphia, PA (US);
Rui Hou, Suzhou, CN;
Hongpeng Yu, Tianjin, CN;
Xi Tao, Suzhou, CN;
Liang Liu, Suzhou, CN;
Wenhua Zhang, Suzhou, CN;
Anatoly Kotlarsky, Holland, PA (US);
Sankar Ghosh, Boothwyn, PA (US);
Michael Schnee, Aston, PA (US);
Pasqual Spatafore, Marlton, NJ (US);
Thomas Amundsen, Turnersville, NJ (US);
Sung Byun, Cherry Hill, NJ (US);
Mark Schmidt, Williamstown, NJ (US);
Garrett Russell, Wilmington, DE (US);
John Bonanno, Woodbury, NJ (US);
C. Harry Knowles, Moorestown, NJ (US);
Metrologic Instruments, Inc., Blackwood, NJ (US);
Abstract
A hand-supportable digital imaging-based bar code symbol reader employing an event-driven system control subsystem, automatic IR-based object detection, and a trigger-switch activated image capture and processing subsystem.