The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2008
Filed:
Mar. 18, 2005
Applicant:
Nobuyuki Yoshikuwa, Kyoto, JP;
Inventor:
Nobuyuki Yoshikuwa, Kyoto, JP;
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 1/22 (2006.01);
U.S. Cl.
CPC ...
Abstract
A foil strain gage is attached to a strained section for outputting a resistance change proportional to a strain generated at the strained section. The foil strain gage includes two grid-shaped resistors disposed in parallel on an insulating base material as detecting sections. The two detecting sections generate identical detection outputs when the foil strain gage is bonded on the strained section.
Yoshikuwa, Nobuyuki. (2008). Load cell with foil strain gauge (U.S. Patent No. 7347109). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7347109
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile