The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2008
Filed:
Jan. 03, 2006
Anders Apelqvist, Malmberget, SE;
Kjell-ove Mickelsson, Koskullskulle, SE;
Seija Forsmo, Malmberget, SE;
Urban Holmdahl, Piteå, SE;
Anders Apelqvist, Malmberget, SE;
Kjell-Ove Mickelsson, Koskullskulle, SE;
Seija Forsmo, Malmberget, SE;
Urban Holmdahl, Piteå, SE;
Luossavaara-Kiirunavaara AB, Lulea, SE;
Abstract
A method for the analysis of the properties of a test specimen comprises: arranging a test specimen between contact surfaces; continuously reducing the distance between the contact surfaces; measuring the diameter of the test specimen when the test specimen makes contact with the contact surfaces; further displacing the contact surfaces in a direction towards each other during the compression of the test specimen until the test specimen disintegrates; storing and continuously recording the force that is applied to the test specimen and the time; recording the maximum forces at all the points of disintegration of the test specimen; increasing the distance between the contact surfaces; and removing the test specimen.
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