The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2008
Filed:
Feb. 01, 2005
Method for estimating propagation noise based on effective capacitance in an integrated circuit chip
Haihua Su, Austin, TX (US);
David J. Widiger, Pflugerville, TX (US);
Ying Liu, Austin, TX (US);
Byron L. Krauter, Round Rock, TX (US);
Chandramouli V. Kashyap, Round Rock, TX (US);
Haihua Su, Austin, TX (US);
David J. Widiger, Pflugerville, TX (US);
Ying Liu, Austin, TX (US);
Byron L. Krauter, Round Rock, TX (US);
Chandramouli V. Kashyap, Round Rock, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system and method for estimating propagation noise that is induced by a non-zero noise glitch at the input of the driver circuit. Such propagation noise is a function of both the input noise glitch and the driver output effective capacitive load, which is typically part of the total wiring capacitance due to resistive shielding in deep sub-micron interconnects. The noise-driven effective capacitance solution provided herein also estimates the propagation noise induced by a non-zero noise glitch at the input of the driving gate. Gate propagation noise rules describing a relationship between the output noise properties and the input noise properties and the output loading capacitance are used within the noise-driven effective capacitance process to determine the linear Thevenin model of the driving gate. The linearized Thevenin driver model is then employed to analyze both the propagation noise and the combined coupling and propagation noise typically seen in global signal nets.