The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2008
Filed:
Oct. 03, 2005
Ilya Gluhovsky, Mountain View, CA (US);
David Vengerov, Sunnyvale, CA (US);
John R. Busch, Cupertino, CA (US);
Ilya Gluhovsky, Mountain View, CA (US);
David Vengerov, Sunnyvale, CA (US);
John R. Busch, Cupertino, CA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
One embodiment of the present invention provides a system that selects bases to form a regression model for cache performance. During operation, the system receives empirical data for a cache rate. The system also receives derivative constraints for the cache rate. Next, the system obtains candidate bases that satisfy the derivative constraints. For each of these candidate bases, the system: (1) computes an aggregate error E incurred using the candidate basis over the empirical data; (2) computes an instability measure I of an extrapolation fit for using the candidate basis over an extrapolation region; and then (3) computes a selection criterion F for the candidate basis, wherein F is a function of E and I. Finally, the system minimizes the selection criterion F across the candidate bases to select the basis used for the regression model.