The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2008
Filed:
Jun. 05, 2002
Laurent Chanas, Houilles, FR;
Frederic Guichard, Paris, FR;
Lionel Moisan, Paris, FR;
Bruno Liege, Boulogne, FR;
Laurent Chanas, Houilles, FR;
Frederic Guichard, Paris, FR;
Lionel Moisan, Paris, FR;
Bruno Liege, Boulogne, FR;
DO Labs, Boulogne, FR;
Abstract
A system and method for producing formatted information related to at least one image-capture appliance and/or at least one image-restitution appliance. The system and method provide for production of formatted information related to defects of the appliance, especially blurring and noise, from a measured field. This measured field is obtained from a universal set by performing the operations: capturing or restituting the universal set by the appliance to produce an image; choosing an image zone within the image; calculating a reference image from the image; selecting, within the reference image, a reference zone homologous to the image zone; choosing a base for representing all or part of the image zones and reference zones; selecting variable characteristics of the appliance; and in this way the measured field is obtained. The system and method are applicable to photographic or video image processing, in optical devices, industrial controls, robotics, metrology, etc.