The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2008
Filed:
Jul. 04, 2005
Peter Forthmann, Hamburg, DE;
Thomas Kohler, Norderstedt, DE;
Peter Forthmann, Hamburg, DE;
Thomas Kohler, Norderstedt, DE;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
The invention relates to a method of computed tomography wherein a radiation source moves relative to an examination zone along a helical trajectory and wherein the movement involves a rotation around a rotational axis and a shifting parallel to the rotational axis. During the movement, a detector unit acquires real measured values. Fictitious measured values are determined from the real measured values by solving John's equation for a virtual movement of the radiation source along an intersection ellipse. The intersection ellipse intersects the helical trajectory at an intersection point and is the intersection of a virtual cylindrical surface, on which the helical trajectory is situated, with an intersection plane that is defined by a tangent vector of the helical trajectory at the intersection point and a vector that is oriented perpendicular to the rotational axis. Finally, an image of the examination zone is reconstructed using the real and fictitious measured values.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile