The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2008

Filed:

Nov. 19, 2002
Applicants:

Norio Fukasawa, Kanagawa, JP;

Junichi Suzuki, Kanagawa, JP;

Kiyoshi Toyota, Tokyo, JP;

Tetsu Tanaka, Tokyo, JP;

Satoru Ishii, Chiba, JP;

Takeshi Kubo, Kanagawa, JP;

Masahiro Saito, Kanagawa, JP;

Inventors:

Norio Fukasawa, Kanagawa, JP;

Junichi Suzuki, Kanagawa, JP;

Kiyoshi Toyota, Tokyo, JP;

Tetsu Tanaka, Tokyo, JP;

Satoru Ishii, Chiba, JP;

Takeshi Kubo, Kanagawa, JP;

Masahiro Saito, Kanagawa, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical pickup device is provided which includes a double-wavelength objective lens () that collects a light beam selectively emitted from a light-emitting/-detecting element () that selectively emits a plurality of light beams different in wavelength from each other, and also return light from an optical disk (), a first diffraction grating () that splits the light beam emitted from a light-emitting/-detecting element () into three beams including a zero-order light beam and positive and negative first-order light beams, a second diffraction grating () that diffracts the return light for traveling along a light path separate from that of the outgoing light, and a third diffraction grating () that corrects a light-path deviation by diffracting the positive first-order light beam diffracted by the second diffraction grating (). The light-emitting/-detecting element () provides a focusing error signal FE by detecting the negative first-order light beam diffracted by the third diffraction element (), and a tracking error signal by detecting return portions of the positive and negative first-order light beams from the first diffraction grating ().


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