The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2008

Filed:

Mar. 18, 2005
Applicants:

Hiroki Nakajima, Kanagawa, JP;

Takayuki Yamanaka, Kanagawa, JP;

Hideki Fukano, Kanagawa, JP;

Yuichi Akage, Kanagawa, JP;

Munehisa Tamura, Chiba, JP;

Tadashi Saitoh, Osaka, JP;

Inventors:

Hiroki Nakajima, Kanagawa, JP;

Takayuki Yamanaka, Kanagawa, JP;

Hideki Fukano, Kanagawa, JP;

Yuichi Akage, Kanagawa, JP;

Munehisa Tamura, Chiba, JP;

Tadashi Saitoh, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/00 (2006.01); G02F 1/03 (2006.01); G02F 1/01 (2006.01); G02F 1/035 (2006.01);
U.S. Cl.
CPC ...
Abstract

In an optical modulation device () having an electrical/optical interaction region (), an electrical signal line () is connected to an electrical signal input terminal (), another electrical signal line () is connected to an electrical signal output terminal (), and a reflection control circuit () is connected to the other electrical signal line (). This reflection control circuit () is an impedance element which positively reflects an output electrical signal from the interaction region () of the optical modulation device (). This makes it possible to raise the upper-limiting frequency at which the E/O (Electrical-to-Optical) response characteristic can be improved, and improve the flatness of the frequency characteristic of the E/O response without deteriorating the absolute value of the E/O response.


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