The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2008
Filed:
Oct. 26, 2002
Udo Haberland, Holzgerlingen, DE;
Udo Haberland, Holzgerlingen, DE;
Agilent Technologies Inc., Santa Clara, CA (US);
Abstract
The present invention relates to an apparatus and to a method of load dependent analyzing an optical component (), comprising the steps of: splitting an initial signal () into the reference signal () into and into a measurement signal (), intermittently providing a load signal () to the component (), providing the measurement signal (), to the component (),so that the component () can influence the measurement signal () to create a signal () influenced by and received from the component (), superimposing the reference signal with the signal () received from the component (), to provide a superimposed signal (), detecting the superimposed signal () when the loading signal () is not present at the component () to provide an information containing signal (), and processing the information containing signal () to determine an optical property of the component () dependent on a property of the load signal ().