The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2008

Filed:

May. 13, 2004
Applicants:

Julian Fong, Seattle, WA (US);

Wayne Wooten, Seattle, WA (US);

Inventors:

Julian Fong, Seattle, WA (US);

Wayne Wooten, Seattle, WA (US);

Assignee:

Pixar, Emeryville, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 15/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for visibility determination and processing. The method includes receiving at least information associated with a plurality of objects, generating a first plurality of geometric primitives based on at least information associated with the plurality of objects, generating a first plurality of grids based on at least information associated with the first plurality of geometric primitives, and shading the first plurality of grids. The generating a first plurality of grids includes generating a second plurality of grids associated with the first plurality of geometric primitives, selecting a third plurality of grids from the second plurality of grids, and selecting the first plurality of grids from the third plurality of grids.


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