The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2008
Filed:
Mar. 18, 2004
John Edwin Berberian, Dallas, TX (US);
Leonard S. Cutler, Los Altos Hills, CA (US);
Miao Zhu, San Jose, CA (US);
John Edwin Berberian, Dallas, TX (US);
Leonard S. Cutler, Los Altos Hills, CA (US);
Miao Zhu, San Jose, CA (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
An apparatus and method for measuring CPT is disclosed. The apparatus includes a quantum absorber that is irradiated by radiation from an electromagnetic radiation source. The quantum absorber includes a material that exhibits CPT. The electromagnetic radiation source generates electromagnetic radiation having first and second CPT-generating frequency components. The first CPT-generating frequency component has a frequency νL−ν, and a first CPT component amplitude. The second CPT generating frequency component has a frequency ν+ν and a second CPT component amplitude. The apparatus also includes a detector for generating a detector signal related to the power of electromagnetic radiation that leaves the quantum absorber. The detector signal exhibits an asymmetry as a function of frequency ν in a frequency range about a frequency ν. The apparatus includes an asymmetry servo loop that alters one of ν, the first CPT component amplitude, and the second CPT component amplitude to reduce the asymmetry.