The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2008

Filed:

Apr. 18, 2007
Applicants:

Tomohiko Kawai, Yamanashi, JP;

Kenzo Ebihara, Yamanashi, JP;

Takayuki Oda, Yamanashi, JP;

Inventors:

Tomohiko Kawai, Yamanashi, JP;

Kenzo Ebihara, Yamanashi, JP;

Takayuki Oda, Yamanashi, JP;

Assignee:

Fanuc Ltd, Yamanashi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23Q 15/007 (2006.01);
U.S. Cl.
CPC ...
Abstract

A machining apparatus capable of irregularly forming a plurality of dimples on a surface of a workpiece in a short period of time. The machining apparatus includes a tool for machining a plurality of dimples on a surface of a workpiece, each dimple having a depth in a first direction; a drive unit for displacing the tool relative to the workpiece in the first direction and a second direction generally perpendicular to the first direction; a controller for controlling the drive unit so as to displace the tool relative to the workpiece in the first direction such that the tool cuts into or leaves the workpiece, while the tool is being moved relative to the workpiece in the second direction, wherein a trigger of the displacement of the tool in the first direction is timing calculated by using a second waveform, the second waveform being determined by comparing the magnitude of a first waveform with a predetermined threshold, at least one of frequency and amplitude of the first waveform being irregular.


Find Patent Forward Citations

Loading…