The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2008
Filed:
Nov. 10, 2005
Dimitri Victorovich Yatsenko, Salt Lake City, UT (US);
Jon Thomas Lea, Hampstead, NH (US);
Charles Frederick Lloyd, Reading, MA (US);
Dimitri Victorovich Yatsenko, Salt Lake City, UT (US);
Jon Thomas Lea, Hampstead, NH (US);
Charles Frederick Lloyd, Reading, MA (US);
General Electric Company, Schenectady, NY (US);
Abstract
Certain embodiments of the present invention provide a method and system for improved calibration of an image acquisition device. Certain embodiments of the system include an image acquisition device for obtaining at least one image of an object and a calibration fixture positioned in relation to the image acquisition device. The calibration fixture includes a radiotranslucent material providing low frequency content for characterizing the image acquisition device. In an embodiment, the calibration fixture includes a plurality of peaks and valleys to create a low frequency signal for characterizing the image acquisition device. The calibration fixture may be positioned between the image acquisition device and an energy source such that a distance between the image acquisition device and the calibration fixture is minimized. In certain embodiments, a grating or other calibration fixture may be used to generate a moiré pattern to calibrate the image acquisition device.