The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2008
Filed:
Dec. 13, 2005
Applicant:
Wen-chao Tseng, Taichung, TW;
Inventor:
Wen-Chao Tseng, Taichung, TW;
Assignee:
Transpacific IP, Ltd., Taipei, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/10 (2006.01); G06K 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of automatically detecting a test result of a probe zone of a test strip Is provided. In one embodiment, he method comprises capturing an image of a bar code and an image of at least one test strip from a scanning object, determining a setting value for the at least one test strip based, at least in part, on said captured image of said bar code, determining a color response of the at least one test strip, based at least in part on the captured image of said at least one test strip, and determining a test result for the at least one test strip, based at least in part on the determined color response and the determined setting value.