The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2008
Filed:
May. 18, 2005
Yoshitaka Fujisawa, Tokorozawa, JP;
Tomoyuki Kaneko, Kodaira, JP;
Yoshitaka Fujisawa, Tokorozawa, JP;
Tomoyuki Kaneko, Kodaira, JP;
Bridgestone Corporation, Tokyo, JP;
Abstract
There are provided an inspection method of tire uneven marks capable of judging defect of three-dimensional form of the mark in a higher reliability without depending on a brightness distribution image of unevenness, and an inspection apparatus of tire uneven marks. The inspection method of tire uneven marks comprises a step of measuring heights of unevenness inclusive of marks to be inspected with respect to each area element in a predetermined tire surface region to acquire unevenness distribution data, a step of specifying a tire surface portion corresponding to a mark model in the tire surface region from data of three-dimensional form of a mark model previously prepared as a template of the each mark and the above acquired unevenness distribution data, and a step of determining a coincidence between the unevenness distribution data of the specified tire surface portion with respect to the each mark and data of three-dimensional form of the mark model to judge an acceptance of the three-dimensional form of the mark based on the coincidence.