The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 18, 2008

Filed:

Nov. 16, 2004
Applicants:

Yoshihiro Sato, Nissin, JP;

Tadayoshi Yasui, Nagoya, JP;

Akihiro Mizutani, Nagoya, JP;

Inventors:

Yoshihiro Sato, Nissin, JP;

Tadayoshi Yasui, Nagoya, JP;

Akihiro Mizutani, Nagoya, JP;

Assignee:

NGK Insulators, Ltd., Nagoya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/207 (2006.01);
U.S. Cl.
CPC ...
Abstract

A shape-measuring devicemeasures the shape of a object to be measuredin which segments are arranged and bonded in rows while relatively moving the objectin one direction. The shape-measuring device includes rollersprovided corresponding to the rows of segments and displaced to follow unevenness of an end faceof the object while being rotated on the end facedue to the relative movement, detection meansprovided corresponding to each rollerand detecting the amount of displacement of each roller, and calculation meansfor calculating shape data of the objectbased on the amount of displacement of the rollerdetected by the detection means. The shape-measuring devicecan accurately and promptly measure the shape of the object such as a DPF in which segments are bonded in rows.


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