The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2008

Filed:

Feb. 08, 2005
Applicants:

Kimihiko Aiba, Osaka, JP;

Yoichiro Mae, Osaka, JP;

Hisato Yoshida, Nara, JP;

Inventors:

Kimihiko Aiba, Osaka, JP;

Yoichiro Mae, Osaka, JP;

Hisato Yoshida, Nara, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

For detecting a failure of a logic circuitprovided in a semiconductor integrated circuit due to deterioration with age, or the like, there is provided a reference-producing circuitusing a logic different from the logic of the logic circuit. The reference-producing circuitproduces an abnormal/normal determination reference S for a predetermined output signal out output from the logic circuit. The reference-producing circuitis made from only a portion of the logic of the logic circuitor with a logic totally different from the logic of the logic circuitto produce the determination reference S, so that the circuit scale of the reference-producing circuitis smaller than that of the logic circuit. The determination reference S from the reference-producing circuitand the output signal out from the logic circuitare compared with each other by a determination circuit


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