The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2008
Filed:
Jan. 31, 2005
Dong-kwan Han, Suwon-si, KR;
Dong-kwan Han, Suwon-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Abstract
A scan based Automatic Test Pattern Generation (ATPG) test circuit, a test method using the test method, and a scan chain reordering method are disclosed. The test circuit tests for scan chains comprising unknown values which could adversely influence a test result. The test circuit uses a scan test point circuit to prevent unknown values from propagating through the test circuit, thus keeping the unknown values from influencing the test result. The reordering method is used where two scan chains comprising an unknown value exist in a single scan cycle so that the unknown values can be located during different clock cycles.