The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2008
Filed:
Jan. 23, 2007
Sung-hee Yun, Suwon-si, KR;
Seung-ho Jung, Suwon-si, KR;
Dae-wook Kim, Seoul, KR;
Moon-hyun Yoo, Suwon-si, KR;
Jong-bae Lee, Yongin-si, KR;
Sung-Hee Yun, Suwon-si, KR;
Seung-Ho Jung, Suwon-si, KR;
Dae-Wook Kim, Seoul, KR;
Moon-Hyun Yoo, Suwon-si, KR;
Jong-Bae Lee, Yongin-si, KR;
Abstract
Disclosed is method for estimating statistical distribution characteristics of product parameters. The method comprises determining n number of product parameters, which characterize a product, and m number of characteristic parameters dependent on the product parameters, determining m number of correlation functions that represent the characteristic parameters in terms of the product parameters, and obtaining inverse functions of the correlation functions that represent the product parameters in terms of the characteristic parameters. After fabricating test products to empirically determine quantitative relations between the product and characteristic parameters, the method includes measuring k number of test products and preparing measured data of the characteristic parameters. Thereafter, the method includes estimating statistical characteristics of the product parameters corresponding with a distribution of the measured data of the characteristic parameters using inverse functions of the correlation functions.