The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2008

Filed:

Jun. 05, 2002
Applicants:

Laurent Chanas, Houilles, FR;

Frederic Guichard, Paris, FR;

Lionel Moisan, Paris, FR;

Bruno Liege, Paris, FR;

Inventors:

Laurent Chanas, Houilles, FR;

Frederic Guichard, Paris, FR;

Lionel Moisan, Paris, FR;

Bruno Liege, Paris, FR;

Assignee:

DO Labs, Boulogne, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and a method for calculating a transformed image from a digital image and from formatted information related to defects of an appliance chain for image capture and/or restitution. The system and method provide for automatically determining the characteristic noise data from formatted information and/or from the digital image. The transformed image can therefore be corrected such that it does not exhibit any visible or annoying defects, especially defects related to noise, as regards its subsequent use. The system and method are applicable to photographic or video image processing, in optical devices, industrial controls, robotics, metrology, etc.


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