The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2008
Filed:
Jul. 25, 2002
Hirokazu Tanaka, Osaka, JP;
Daisuke Arai, Osaka, JP;
Toshiaki Anzaki, Osaka, JP;
Takashi Ikuno, Osaka, JP;
Kazuhiro Doushita, Osaka, JP;
Hirokazu Tanaka, Osaka, JP;
Daisuke Arai, Osaka, JP;
Toshiaki Anzaki, Osaka, JP;
Takashi Ikuno, Osaka, JP;
Kazuhiro Doushita, Osaka, JP;
Nippon Sheet Glass Company, Limited, Tokyo, JP;
Abstract
There is provided a method for evaluating the contamination by quantifying the surface contamination of an object such as a window glass plate, a wall, or the like in such a manner that the quantified value is close to the visual sensation of human being. The method comprises the steps of taking a color image of the surface of the object, converting a color image data denoting the color image into a monochromatic image data, dividing a monochromatic image denoted by the monochromatic image data into a dot matrix to obtain lightness per dot, selecting an area to be evaluated on the dot matrix, calculating a standard deviation of lightness from the distribution of lightness of the selected area.