The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2008

Filed:

Mar. 10, 2003
Applicant:

Hermann Schomberg, Hamburg, DE;

Inventor:

Hermann Schomberg, Hamburg, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/083 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to an X-ray apparatus which includes an X-ray source () for the emission of a conical X-ray beam and an X-ray detector () for the multiple detection of the X-rays after their passage through an object to be examined, being arranged along an object axis (), while the X-ray source () and the X-ray detector () are displaced along a trajectory. In order to increase the size of the reconstructable examination zone without increasing the size of the X-ray detector, and in order to minimize the problem caused by projections truncated in the transverse direction, the invention proposes an X-ray apparatus which includes means () for changing the position and/or the orientation of the X-ray detector () relative to the X-ray source () and a control unit () for displacing the X-ray source () and the X-ray detector () along the trajectory and for controlling the position and/or the orientation of the X-ray detector () during the detection of the X-rays.


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