The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2008
Filed:
Jul. 13, 2005
Kiyoshi Yagita, Tokyo, JP;
Kiyoshi Yagita, Tokyo, JP;
Scan Technology Co., Ltd., Tokyo, JP;
Abstract
An inspecting apparatus for detecting a foreign matter in a container having a recessed and protruding shape includes: illumination units arranged annularly on inner and outer sides of an annular carrier line and casting parallel lights onto the inspection subject from the outside thereof; image pickup units arranged on the outside of the annular carrier line and receiving lights from the inspection subject, simultaneously from two directions around the inspection subject, and picking up images of the inspection subject; wherein the image pickup units pick up images of the inspection subject in a state where an angle θformed by light-receiving axes of the image pickup units is 30 to 90 degrees and an angle θformed by the light-receiving axis of the image pickup unit and the light of the illumination unit next to the image pickup unit is 30 to 60 degrees.