The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2008
Filed:
Dec. 08, 2004
Christian Laue, Mainz, DE;
Gernot Brasen, Mainz, DE;
Frank Lautenbach, Mainz, DE;
Matthias Loeffler, Eisenberg, DE;
Heiko Theuer, Mainz, DE;
Christian Laue, Mainz, DE;
Gernot Brasen, Mainz, DE;
Frank Lautenbach, Mainz, DE;
Matthias Loeffler, Eisenberg, DE;
Heiko Theuer, Mainz, DE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
The invention relates to a system and method of detecting impurities in a cylindrically shaped transparent medium, wherein the cylindrically shaped transparent medium is illuminated with electromagnetic radiation, and the radiation having components emerging radially from the medium, and at least some of the components are received by a detector for detecting impurities of the medium. The components are detected at a multiplicity of relative angular positions around the symmetry axis of the cylinder, so as to form an impurity diagram that may be analyzed to detect and measure impurities in the medium.