The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2008
Filed:
Dec. 08, 2005
Manjul Bhushan, Hopewell Junction, NY (US);
Karen M. G. V. Gettings, N. Chelmsford, MA (US);
Wilfried E. Haensch, Somers, NY (US);
Brian L. Ji, Fishkill, NY (US);
Mark B. Ketchen, Hadley, MA (US);
Manjul Bhushan, Hopewell Junction, NY (US);
Karen M. G. V. Gettings, N. Chelmsford, MA (US);
Wilfried E. Haensch, Somers, NY (US);
Brian L. Ji, Fishkill, NY (US);
Mark B. Ketchen, Hadley, MA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method of measuring variability of integrated circuit components is provided. A specified parameter of at least one first array configuration comprising a plurality of the integrated circuit components without specified internal connections between the integrated circuit components is measured. The specified parameter of at least one second array configuration comprising a plurality of the integrated circuit components nominally identical to those of the first array configuration with specified internal connections between the integrated circuit components is also measured. A variation coefficient is determined for the integrated circuit components based on the measured specified parameter of the at least one first array configuration and the at least one second array configuration.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile