The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2008
Filed:
May. 03, 2004
Jeffrey Bottman, Seattle, WA (US);
Michael Kirita, Seattle, WA (US);
Arthur B Liggett, Snohomish, WA (US);
Jeffrey Bottman, Seattle, WA (US);
Michael Kirita, Seattle, WA (US);
Arthur B Liggett, Snohomish, WA (US);
Fluke Corporation, Everett, WA (US);
Abstract
A test instrument employs main and remote test units at respective ends of a cable under test. The units operate in an active or passive measurement mode, wherein one of the units begins as the active unit, applying test signals to the cable under test to make a set of measurements related thereto, while the other unit takes measurements based on the signals applied by the first end. Then, after a set of measurements has been completed, the units swap roles, and the original passive end becomes the active end, applying test signal stimuli, while the original active end now becomes passive, and takes a series of corresponding measurements based from the test stimuli from the active end. The measurements are thereby overlapped and accomplished from both ends of the cable, saving time.