The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2008
Filed:
May. 31, 2005
Applicants:
Akinori Araya, Yokohama, JP;
Makio Ueno, Kamiina-gun, JP;
Inventors:
Akinori Araya, Yokohama, JP;
Makio Ueno, Kamiina-gun, JP;
Assignee:
Olympus Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
H01J 3/14 (2006.01); G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
A laser scanning microscope includes an acousto-optic element or an electro-optic element in an illumination optical system which introduces a laser beam from a laser beam source of the laser scanning microscope into a microscope. The laser scanning microscope further includes a beam expander disposed between the laser beam source and the acousto-optic element or the electro-optic element.
Quick Actions:
Araya, Akinori. (2008). Laser scanning microscope (U.S. Patent No. 7342219). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7342219
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile