The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2008
Filed:
Mar. 23, 2006
Thomas William Birdwell, Middletown, OH (US);
Thomas William Birdwell, Middletown, OH (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for aligning a radiographic inspection system includes providing a radiation source capable of emitting a beam pattern, positioning a detector to receive radiation emitted from the radiation source, and causing the radiation source to emit the beam pattern. The detector is used to determine the distribution of flux intensity of the beam pattern. A two-dimensional or three-dimensional map of the beam pattern may be stored. The system is aligned by positioning the radiation source and the detector with reference to the map, so that the detector is disposed at a predetermined location within the beam pattern.