The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 11, 2008

Filed:

Nov. 15, 2002
Applicants:

Yasufumi Fukuma, Tokyo, JP;

Kohji Nishio, Tokyo, JP;

Takefumi Hayashi, Tokyo, JP;

Eiichi Yanagi, Tokyo, JP;

Noriyuki Nagai, Tokyo, JP;

Yasuo Kato, Tokyo, JP;

Yukio Ikezawa, Tokyo, JP;

Mineki Hayafuji, Tokyo, JP;

Tadashi Okamoto, Tokyo, JP;

Masakazu Hayashi, Tokyo, JP;

Inventors:

Yasufumi Fukuma, Tokyo, JP;

Kohji Nishio, Tokyo, JP;

Takefumi Hayashi, Tokyo, JP;

Eiichi Yanagi, Tokyo, JP;

Noriyuki Nagai, Tokyo, JP;

Yasuo Kato, Tokyo, JP;

Yukio Ikezawa, Tokyo, JP;

Mineki Hayafuji, Tokyo, JP;

Tadashi Okamoto, Tokyo, JP;

Masakazu Hayashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optometric apparatusaccording to the present invention comprises a body portionprovided with an optical system for a right eye for projecting a chart for the right eye in order to inspect visual function of both eye of an examinee and a body portionprovided with an optical system for a left eye for projecting a chart for the left eye, the optical systems for the right and left eyes projecting the same fusion patterns to perform fusion of the both eyes of the examinee.


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