The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 11, 2008
Filed:
Jun. 28, 2005
Applicants:
Chih-lin Huang, Bellevue, WA (US);
Clements C. Lambeth, Hot Springs, AR (US);
Inventors:
Chih-Lin Huang, Bellevue, WA (US);
Clements C. Lambeth, Hot Springs, AR (US);
Assignee:
Weyerhaeuser Company, Federal Way, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01); G01N 29/18 (2006.01);
U.S. Cl.
CPC ...
Abstract
Methods are provided for using stress wave velocity measurements taken of a specimen at an early age to determine potential characteristics at a later age. The data may be used to, for example, evaluate specimens and/or families and/or clones at early ages to cut costs and/or to increase a rate of genetic gains. The specimens may be, for example, seedlings and/or explants of forestry and/or agricultural and/or horticultural species. The stress wave measurements may be obtained using conventional devices and/or systems and/or methods.